Page 2: Research news on x-ray diffraction

X-ray diffraction (XRD) is an analytical method that probes the periodic arrangement of atoms in crystalline materials by measuring the angular distribution and intensity of X-rays scattered by the crystal lattice. When a monochromatic X-ray beam interacts with a periodic electron density, constructive interference occurs at specific angles that satisfy Bragg’s law, nλ = 2d sinθ, yielding diffraction patterns characteristic of the crystal structure. Analysis of peak positions provides unit cell parameters and symmetry, while intensities enable determination of atomic positions, thermal factors, and occupancies. XRD is fundamental for phase identification, quantitative phase analysis, texture characterization, and refinement of crystal structures in materials science, chemistry, geology, and biology.