Technique to improve high precision and nanotechnology surface measurement

Aug 20, 2013

(Phys.org) —A University of Warwick scientist has conceived a new method to improve the measurement of the surfaces of components essential for use in high-precision and nanotechnology applications.

With the requirement for ever higher performance of smaller and smaller parts, emphasis is having to be placed on their surfaces in order to produce high-value products.

Two emerging consequences are the use of patterns and structures on surfaces, and complex forms, all of which have to be rigorously controlled in order to optimise such areas as lubrication, adhesion and .

Key to these improvements is the measurement of these surfaces in order to manufacture to high precision with a minimum of defects - a big problem for traditional measuring techniques.

A new idea conceived by Professor David Whitehouse of the School of Engineering promises to be a first step towards addressing these new measurement problems.

He has devised a technique based on Gaussian filtering, but having a new mathematical stratagem which is described in the Proceedings of the Royal Society. The technique is similar to except that it takes into account geometry rather than just intensity variations.

He said: "his technique enhances the sharp features which are inherently present on high-tech structured surfaces such as edges, grooves and boundaries in a way which enables their detailed and position to be better determined than previous methods. It can also facilitate the detection and characterization of defects on the surfaces."

Structured and free form surface applications over a wide range of sizes, for example in the optical, semiconductor, and in nanotechnology could, if the method realises its potential, benefit directly.

Explore further: Air quality measurements: New manufacturing method for nano gas sensors opens doors

More information: Whitehouse D J. Theoretical enhancement of the Gaussian filtering of engineering surfaces, Proc. R. Soc. A, 2013 Vol. 469, No 2158, 20130184. rspa.royalsocietypublishing.or… 58/20130184.abstract

Related Stories

NIST chip measurement advance earns 'oscar of innovation'

Jul 15, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for its National Institute of Standards and Technology (NIST) inventors.

A durable, bacteria-killing surface for hospitals

Aug 16, 2013

Scientists at EPFL have developed a new method for making antimicrobial surfaces that can eliminate bacteria under a minute. The technology, now tested in a hospital, shows enormous potential for preventing ...

Bright future beckons for metrology researcher

Jul 10, 2013

A BRIGHT future beckons for a University of Huddersfield metrology instrumentation designer who has recently completed his doctorate, won a national award and will now embark on a project to bring a patented ...

Recommended for you

A crystal wedding in the nanocosmos

Jul 23, 2014

Researchers at the Helmholtz-Zentrum Dresden-Rossendorf (HZDR), the Vienna University of Technology and the Maria Curie-Skłodowska University Lublin have succeeded in embedding nearly perfect semiconductor ...

PPPL studies plasma's role in synthesizing nanoparticles

Jul 22, 2014

DOE's Princeton Plasma Physics Laboratory (PPPL) has received some $4.3 million of DOE Office of Science funding, over three years, to develop an increased understanding of the role of plasma in the synthesis ...

User comments : 0