Page 2: Research news on scanning electron microscopy

Scanning electron microscopy (SEM) is an electron-beam–based imaging method in which a focused, raster-scanned electron probe interacts with a specimen surface to generate signals such as secondary electrons, backscattered electrons, and characteristic X-rays. These signals are collected by detectors to produce high-resolution, high-depth-of-field images and, with appropriate detectors, compositional or crystallographic information. SEM typically operates under high vacuum, though variable-pressure and environmental modes allow imaging of non-conductive or hydrated samples with reduced preparation. Common applications include surface morphology characterization, microstructural analysis, failure analysis, and correlative studies with techniques like EDS/EBSD for integrated materials and biological research.

Image: Micro-world within an atomic clock

What looks like an aerial shot of an alien landscape is actually a scanning electron microscope view of a test glass surface, acquired as part of a project to improve the lifetime of spaceborne atomic clocks, found at the ...

Monte Carlo simulations bring new focus to electron microscopy

With highly specialized instruments, we can see materials on the nanoscale—but we can't see what many of them do. That limits researchers' ability to develop new therapeutics and new technologies that take advantage of their ...

Researchers find whimsy at the nano scale

At extremely small scales, looks can be deceiving. While at first glance you might see lily pads floating on a tranquil pond, this image is actually a clever adaptation of a snapshot taken on a scanning electron microscope.

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