Research news on scanning electron microscopy

Scanning electron microscopy (SEM) is an electron-beam–based imaging method in which a focused, raster-scanned electron probe interacts with a specimen surface to generate signals such as secondary electrons, backscattered electrons, and characteristic X-rays. These signals are collected by detectors to produce high-resolution, high-depth-of-field images and, with appropriate detectors, compositional or crystallographic information. SEM typically operates under high vacuum, though variable-pressure and environmental modes allow imaging of non-conductive or hydrated samples with reduced preparation. Common applications include surface morphology characterization, microstructural analysis, failure analysis, and correlative studies with techniques like EDS/EBSD for integrated materials and biological research.

Researchers clarify how cells remove damaged endoplasmic reticulum

The cell's endoplasmic reticulum (ER) plays a central role in protein synthesis, folding, and calcium (Ca²⁺) storage. When damaged, ER-phagy (self-eating) removes affected ER regions via double-membrane vesicles called autophagosomes. ...

Antarctic drilling peers deep into ice shelf's past

Scientists say they have drilled deeper than ever beneath the West Antarctic Ice Sheet, peering back millions of years to reveal signs it was once, at least in part, open ocean.

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