Search results for: AFM

JILA's short, flexible, reusable AFM probe

(Phys.org) —JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. ...

dateApr 09, 2014 in Nanophysics
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AFM tips from the microwave

Scientists from the Friedrich-Schiller-University Jena (Germany) have succeeded in improving a fabrication process for Atomic Force Microscopy (AFM) probe tips.

dateOct 21, 2010 in Nanophysics
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