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All-fiber ellipsometer for nanoscale dielectric coatings

Measuring the refractive index and the thickness of thin films (films with a thickness from less than a nanometer to several microns) is essential to characterize them and improve the performance of sensors and devices that ...

NASA's new greenhouse gas detector moves closer to launch

A state-of-the-art imaging spectrometer, which will measure the greenhouse gases methane and carbon dioxide from space, moved closer to launch this month after being delivered to a clean room at Planet Labs PBC (Planet) in ...

X-photon 3D nanolithography

Multiphoton lithography (MPL) is a technique that uses ultra-short laser pulses to create complex three-dimensional (3D) structures at the micro- and nanoscale. It is based on the principle of multiphoton absorption (MPA), ...

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