Path towards non-Si devices presented at IEDM 2012

At this week's IEEE International Electron Devices Meeting (IEDM 2012), imec addressed key challenges of scaling beyond silicon-channel finFETs. Imec showed that channel mobility can be boosted by growing non-Si channels ...

Record performance of dual-gate organic TFT-based RFID circuit

At today's International Solid State Circuit Conference (ISSCC), Holst Centre, Imec and TNO present a dual-gate-based organic RFID chip with record data rate and lowest reported operating voltage. For the first time, the ...

Optical demonstration of quantum fault-tolerant threshold

Dealing with experimental errors, which could occur in every step of quantum circuits, is of great importance, especially in the implementation of quantum computation. Generally speaking, quantum error correction requires ...

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