New method enhances X-ray microscopy for detecting tiny defects

X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult to detect small cracks or tiny inclusions ...

Research team discovers new property of light

A research team headed by chemists at the University of California, Irvine has discovered a previously unknown way in which light interacts with matter, a finding that could lead to improved solar power systems, light-emitting ...

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