Imaging technique reveals strains and defects in vanadium oxide

Researchers led by Edwin Fohtung, an associate professor of materials science and engineering at Rensselaer Polytechnic Institute, have developed a new technique for revealing defects in nanostructured vanadium oxide, a widely ...

Team develops sensitive new way of detecting transistor defects

Researchers at the National Institute of Standards and Technology (NIST) and collaborators have devised and tested a new, highly sensitive method of detecting and counting defects in transistors—a matter of urgent concern ...

Innovative sensor specifically and precisely detects molecules

Researchers of Karlsruhe Institute of Technology (KIT) and Technical University of Darmstadt have developed a novel sensor for gas molecules by combining a graphene transistor with a customized metal-organic coating. The ...

New way to investigate the electric double layer effect

Progress in lithium-ion (Li-ion) batteries have made all sorts of portable devices feasible and fueled the growth of electronics. However, the intrinsic disadvantages of conventional Li-ion batteries, whose cells use a liquid ...

Ultracold transistors serve as their own memory devices

Digital transistors—assembled by the billions in today's computer chips—act as near-perfect electronic switches. In the "on" position, achieved when an above-threshold voltage is applied to the device, the transistor ...

'Bite' defects revealed in bottom-up graphene nanoribbons

Graphene nanoribbons (GNRs), narrow strips of single-layer graphene, have interesting physical, electrical, thermal, and optical properties because of the interplay between their crystal and electronic structures. These novel ...

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