New Fujitsu V series FRAMs deliver optimal design flexibility

Fujitsu Semiconductor America (FSA) today extended its growing portfolio of Ferroelectric memory products with the introduction of a new Ferroelectric Random Access Memory (FRAM) product series that features a wide voltage ...

Diamonds are a probe’s best friend

Surface imperfections in devices such as gears or levers can have disastrous effects on reliability. Recent studies have demonstrated the usefulness of atomic force microscopes (AFMs) — instruments that use tiny silicon-based ...

Argon cleaning helps trapped ions chill out

(PhysOrg.com) -- The reliability of trapped-ion quantum information systems – a promising candidate technology for an eventual quantum computer – can be dramatically improved by giving the trap electrodes a good ...

Coming soon to a server near you: fewer internet delays

(PhysOrg.com) -- Researchers at the UA-led Center for Integrated Access Networks, the largest optical research center in the U.S., are developing methods to improve transmission speed, efficiency and reliability of Internet ...

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