Microtechnology: Double-layer capping solves two problems

Continual downsizing of technology means that researchers have to develop ever more ingenious methods of packaging and protecting their tiny devices. Jae-Wung Lee and co-workers at the A*STAR Institute of Microelectronics, ...

First precise MEMS output measurement technique unveiled

The commercial application of MEMS, or micro-electro-mechanical systems, will receive a major boost today following the presentation of a brand new way to accurately measure the power requirements and outputs of all existing ...

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