Nanowires as sensors in new type of atomic force microscope

A new type of atomic force microscope (AFM) uses nanowires as tiny sensors. Unlike standard AFM, the device with a nanowire sensor enables measurements of both the size and direction of forces. Physicists at the University ...

Novel microscopy pencils patterns in polymers at the nanoscale

Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides ...

JILA's short, flexible, reusable AFM probe

(Phys.org) —JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer ...

Microscopic fountain pen to be used as a chemical sensor

The Atomic Force Microscope (AFM), which uses a fine-tipped probe to scan surfaces at the atomic scale, will soon be augmented with a chemical sensor. This involves the use of a hollow AFM cantilever, through which a liquid ...

Nanometer-scale diamond tips improve nano-manufacturing

(Phys.org)—One of the most promising innovations of nanotechnology has been the ability to perform rapid nanofabrication using nanometer-scale tips. The fabrication speed can be dramatically increased by using heat. High ...

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