Building the next generation of efficient computers

UConn researcher Bryan Huey has uncovered new information about the kinetic properties of multiferroic materials that could be a key breakthrough for scientists looking to create a new generation of low-energy, highly efficient, ...

Novel microscopy pencils patterns in polymers at the nanoscale

Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides ...

JILA's short, flexible, reusable AFM probe

(Phys.org) —JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability in picoscale force measurements. Shorter, softer ...

Microscopic fountain pen to be used as a chemical sensor

The Atomic Force Microscope (AFM), which uses a fine-tipped probe to scan surfaces at the atomic scale, will soon be augmented with a chemical sensor. This involves the use of a hollow AFM cantilever, through which a liquid ...

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