Atomic force microscopy (AFM) is an extremely sensitive technique that allows us to image materials and/or characterize their physical properties on the atomic scale by sensing the force above material surfaces using a precisely ...
May 10, 2017 in Nanophysics
A French and Japanese research group has developed a new way of visualizing the atomic world by turning data scanned by an atomic force microscope into clear color images. The newly developed method, which enables observation ...
Oct 17, 2017 in General Physics
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