Atomic force microscopy (AFM) is a technique that allows researchers to analyze surfaces at the atomic scale, and it's based on a surprisingly simple concept: A sharp tip on a cantilever "senses" the topography of samples.
Nanophysics
Aug 8, 2016
0
869
(Phys.org)—A team of researchers with Swinburne University of Technology in Australia has found a way to use two-beam super-resolution lithography to create 3D photonic "gyroid" nanostructures—similar to those found in ...
(Phys.org) —Researchers from North Carolina State University, the University of North Carolina at Chapel Hill and Laser Zentrum Hannover have discovered that a naturally-occurring compound can be incorporated into three-dimensional ...
Biochemistry
Oct 23, 2013
0
0
