The narrowest conducting wires in silicon ever made – just four atoms wide and one atom tall – have been shown to have the same electrical current carrying capability of copper, according to a new study published ...
Nanophysics
Jan 5, 2012
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Electronics are getting smaller and smaller, flirting with new devices at the atomic scale. However, many scientists predict that the shrinking of our technology is reaching an end. Without an alternative to silicon-based ...
Nanomaterials
Jan 4, 2012
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A research group at the NIMS International Center for Materials Nanoarchitectonics (MANA) has proved that the electrical resistance of a metal single atomic layer on a silicon surface becomes zero by superconductivity.
Superconductivity
Nov 24, 2011
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(PhysOrg.com) -- Nanotechnology researchers at the Georgia Institute of Technology have conducted the first direct comparison of two fundamental techniques that could be used for chemically doping sheets of two-dimensional ...
Nanomaterials
Nov 7, 2011
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In the latest issue of Elsevier's Materials Today, researchers from Spain and Belgium reported on the innovative use of carbon nanotubes to create mechanical components for use in a new generation of micro-machines. While ...
Nanomaterials
Oct 25, 2011
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Scientists from the Georgia Institute of Technology have for the first time provided details of their "confinement controlled sublimation" technique for growing high-quality layers of epitaxial graphene on silicon carbide ...
Nanomaterials
Sep 22, 2011
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(PhysOrg.com) -- On the macroscale, silicon is a brittle material that cannot be easily molded into a desired shape. But scientists have found that a piece of silicon just 3 nm long can be stretched to more than 20 times ...
Will the future bring us the teleportation devices of "Star Trek" or the sinister machines of the "Matrix"? Theoretical physicist Michio Kaku of the City College of New York says that many of the things that were once the ...
Other
Jun 14, 2011
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(PhysOrg.com) -- After several hours of exposure to sunlight, silicon solar cells experience light-induced degradation, which can decrease their efficiency by up to 10%. In a new study, scientists have attempted to detect ...
(PhysOrg.com) -- The atomic force microscope (AFM) is an important tool for nanoscale surface metrology. Typical AFMs map local tip-surface interactions by scanning a flexible cantilever probe over a surface. They rely on ...
Nanophysics
Jun 2, 2011
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