Over the past decade, Christine Mahoney and a team of scientists at the National Institute of Standards and Technology (NIST) in Maryland have been working to stop the threat of terrorist-based attacks in the form of explosives ...
Analytical Chemistry
Oct 21, 2010
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(Phys.org)—A team of researchers from the NIST Center for Nanoscale Science and Technology, the Royal Institute of Technology, Stockholm, and the University of Maryland have demonstrated a microscopy method to identify ...
General Physics
Sep 13, 2012
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Metrology ― the science of measurement ― plays an essential role in advancing science and technology. Precise definitions and measurements underpin almost all scientific and technological developments, from the astrophysical ...
General Physics
Feb 24, 2016
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13
In an article recently published in Nature Physics, experts from NPL and partner organizations from around the globe explore the critical role of National Metrology Institutes (NMIs) in the quantum revolution.
Quantum Physics
Jul 14, 2022
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14
Researchers have developed a lightweight optical system for 3D inspection of surfaces with micron-scale precision. The new measurement tool could greatly enhance quality control inspection for high-tech products including ...
Optics & Photonics
Aug 23, 2021
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438
Advances in the field of metrology have resulted in totally novel instruments the raw data of which needs to be presented in images comprehensible to human beings, which is why Torsten Enßlin's group at the Max Planck Institute ...
Software
Feb 28, 2019
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11
First responders rely increasingly on wireless communication devices, and in emergencies they cannot afford major signal loss or delay caused by attenuation, interference, or reflection. Because lives are on the line and ...
Other
Jul 30, 2012
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Imec and PVA Tepla present breakthrough results in the detection of TSV voids in 3D stacked IC technology. After having applied Scanning Acoustic Microscopy to temporary wafer (de)bonding inspection, they successfully used ...
Electronics & Semiconductors
Jan 17, 2013
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A new laser speckle angular measurement (SAM) technique detailed in a paper in Light: Science and Applications demonstrates how slope error measurements can be reduced dramatically. This is important because X-ray mirrors ...
Optics & Photonics
Sep 23, 2021
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61
Imec and Tokyo Electron (TEL) announce that they will accelerate their Directed Self-Assembly (DSA) activities at imec's recent 300mm fab-compatible DSA process line. Over the past two years, both companies have been actively ...
Electronics & Semiconductors
Oct 8, 2012
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