Research news on Scanning techniques

Scanning techniques are instrumental methodologies that acquire spatially resolved information from a specimen or environment by systematically interrogating it point-by-point or line-by-line, often using a focused probe such as photons, electrons, ions, or mechanical tips. These techniques include modalities like scanning electron microscopy, scanning probe microscopies, and various spectroscopic scanning methods, which map physical, chemical, or electronic properties across a surface or volume. Key parameters include spatial and temporal resolution, signal-to-noise ratio, and contrast mechanisms determined by probe–sample interactions. Scanning techniques are fundamental for nanoscale characterization, metrology, and defect analysis in materials science, biology, and semiconductor research.

Machine learning accelerates analysis of fusion materials

Tungsten's superior performance in extreme environments makes it a leading candidate for plasma-facing components (PFCs) in fusion reactors, but the ultra-high heat can damage its microscopic structure and lead to component ...

page 1 from 12