Archive: 4/03/2005

FEI Introduces Nova NanoSEM

New System is the World's First SEM for Ultra-High Resolution Characterization of Non-Conductive or Contaminating Samples FEI Company released the newest member of its Nova(TM) family of SEM and DualBeam(TM) systems, the ...

dateMar 04, 2005 in
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Live pictures in 3D

A design engineer’s job is never easy – designing exhaust pipes, packaging or industrial plant demands considerable ingenuity. Researchers at the Fraunhofer Institute for Telecommunications, Heinrich-Hertz Institut HHI ...

dateMar 04, 2005 in
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