Researchers demonstrate a high-speed electrical readout method for graphene nanodevices

But a complication to their application in comes in the form of gaining accurate measurements of the quantum bit states. Most research has primarily used low-frequency electronics to overcome this. However, for applications that demand faster electronic measurements and insights into the rapid dynamics of electronic states, the need for quicker and more sensitive measurement tools has become evident.

Now, a group of researchers from Tohoku University have outlined improvements to (rf) reflectometry to achieve a high-speed readout technique. Remarkably, the breakthrough involves the use of itself. The details of their study were reported in the journal Physical Review Applied.

Rf reflectometry works by sending radio frequency signals into a and then measuring the reflected signals to obtain information about samples. But in devices employing , the presence of significant stray capacitance in the measurement circuit leads to rf leakage and less-than-optimal resonator properties. While various techniques have been explored to mitigate this, clear device design guidelines are still awaited.

(a) The layer structure of the fabricated device. (b) The resonant circuit used for rf-reflectometry. Credit: Tomoya Johmen et al.

The dependence of rf reflection characteristics on gate voltage, showing the change in conductance. Credit: Tomoya Johmen et al.

Coulomb diamonds originating from the formation of quantum dots are observed by monitoring the reflected voltage from the resonator. Credit: Tomoya Johmen et al.