The technology is a hybrid X-ray system that combines conventional X-ray transmission radiography with X-ray diffraction tomography. The former involves measuring the X-rays that pass straight through an object. The latter involves gathering deflection angle and wavelength information from X-rays that have scattered (or bounced) off of an object, which provide a sort of "fingerprint" unique to that material's atomic structure.
One of the hurdles to adopting this technology is that the scattered X-ray signal is typically very weak and complex. This results in very few X-rays reaching the detector with each image captured, which leads to long delays while the scanner gathers enough data for the job at hand.