All-fiber ellipsometer for nanoscale dielectric coatings

Measuring the refractive index and the thickness of thin films (films with a thickness from less than a nanometer to several microns) is essential to characterize them and improve the performance of sensors and devices that ...

HL-LHC magnet alignment system passes crucial tests

The many CERN-developed sensors and software programs of the FRAS (Full Remote Alignment System) have been successfully tested on a prototype magnet in preparation for the HL-LHC.

page 7 from 40