Unique ferroelectric microstructure revealed for first time

A team of researchers have observed and reported for the first time the unique microstructure of a novel ferroelectric material, enabling the development of lead-free piezoelectric materials for electronics, sensors, and ...

New metrological technique uses stress for nanotomography

Researchers from Skoltech and their colleagues in Russia and Spain have reported a proof-of-concept demonstration of a new radiation-safe method for mapping the internal structure and stress distribution in samples of materials ...

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