Researchers at the Department of Energy's Oak Ridge National Laboratory have reported progress in fabricating advanced materials at the nanoscale. The spontaneous self-assembly of nanostructures composed of multiple elements ...
Nanomaterials
Nov 12, 2012
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(Phys.org)—Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron microscope (ESTEM) to control the size and placement ...
Nanomaterials
Nov 1, 2012
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(Phys.org)—NIST's ability to determine the composition and physics of nanoscale materials and devices is about to improve dramatically with the arrival of a new near-field scanning microwave microscope (NSMM).
Nanophysics
Oct 1, 2012
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By measuring the unique properties of light on the scale of a single atom, researchers from Duke University and Imperial College, London, believe that they have characterized the limits of metal's ability in devices that ...
Nanophysics
Aug 30, 2012
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(Phys.org) -- Aiming to use electron spins for storing, transporting and processing information, researchers from IBM and scientists at ETH Zurich, a leading European university, today revealed the first-ever direct mapping ...
General Physics
Aug 12, 2012
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Promising news for those who relish the prospects of a one-inch chip storing multiple terabytes of data, some clarity has been brought to the here-to-fore confusing physics of ferroelectric nanomaterials. A multi-institutional ...
Nanophysics
Jul 10, 2012
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Energy-efficient, high-speed electronics on a nanoscale and screens for mobile telephones and computers that are so thin they can be rolled up. Just a couple of examples of what the super-material graphene could give us. ...
Nanomaterials
Jun 18, 2012
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(Phys.org) -- Graphene is the wonder material that could solve the problem of making ever faster computers and smaller mobile devices when current silicon microchip technology hits an inevitable wall. Graphene, a single layer ...
Nanophysics
May 28, 2012
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(Phys.org) -- Researchers sponsored by Semiconductor Research Corporation (SRC) announced that they have successfully created contact hole patterns for a wide variety of practical logic and memory devices using a next-generation ...
Electronics & Semiconductors
May 24, 2012
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(Phys.org) -- Researchers from the NIST Center for Nanoscale Science and Technology and Massachusetts Institute of Technology have used the scanning electron microscopy with polarization analysis (SEMPA) technique to provide ...
Nanophysics
Apr 19, 2012
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