Curving light in a record-setting way

A team led by scientists and engineers from the University of Wisconsin-Madison, the University of Southern California and Washington University in St. Louis, has created a unique, record-setting material that can bend one ...

All-fiber ellipsometer for nanoscale dielectric coatings

Measuring the refractive index and the thickness of thin films (films with a thickness from less than a nanometer to several microns) is essential to characterize them and improve the performance of sensors and devices that ...