Quantifying corn rootworm damage

Every year farmers spend a lot of money trying to control corn rootworm larvae, which are a significant threat to maize production in the United States and, more recently, in Europe. University of Illinois researchers have ...

Toshiba introduces new embedded-NAND flash memory in 24nm process

Toshiba Corporation today announced that it has enhanced its NAND flash portfolio with the introduction of next-generation 24-nanometer (nm) generation "SmartNAN," which integrate robust error management into the NAND package. ...