News tagged with afm

Faster imaging at the nano level

Tufts researchers have discovered a new, faster way to image materials at the nano level, an advance that could speed the detection of cancer and assist in the development of new high-tech materials.

dateSep 27, 2017 in Nanophysics
shares25 comments 0

Engineers shrink microscope to dime-sized device

Researchers at The University of Texas at Dallas have created an atomic force microscope on a chip, dramatically shrinking the size—and, hopefully, the price tag—of a high-tech device commonly used to characterize material ...

dateFeb 15, 2017 in Nanophysics
shares57 comments 1