All-fiber ellipsometer for nanoscale dielectric coatings

Measuring the refractive index and the thickness of thin films (films with a thickness from less than a nanometer to several microns) is essential to characterize them and improve the performance of sensors and devices that ...

Revealing the effect of AIN surface pits on GaN remote epitaxy

Remote epitaxy has been gaining attention in the field of semiconductor manufacturing for growing thin films that copy the crystal structure of the template, which can later be exfoliated to form freestanding membranes. However, ...

Making big leaps in understanding nanoscale gaps

Creating novel materials by combining layers with unique, beneficial properties seems like a fairly intuitive process—stack up the materials and stack up the benefits. This isn't always the case, however. Not every material ...

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