All-fiber ellipsometer for nanoscale dielectric coatings

Measuring the refractive index and the thickness of thin films (films with a thickness from less than a nanometer to several microns) is essential to characterize them and improve the performance of sensors and devices that ...

Digging water channels in mineral stishovite

Stishovite has the same chemical formula as silica quartz (SiO2) but it has much higher density. While SiO2 is abundant on Earth's crust, it is also a major component of basalt, a type of igneous rock that is rich in iron ...

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