For the first time X-ray scientists have combined high-resolution imaging with 3-D viewing of the surface layer of material using X-ray vision in a way that does not damage the sample.
General Physics
Aug 13, 2012
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(PhysOrg.com) -- Researchers in the CNST have used photoconductive atomic force microscopy (PCAFM) to characterize the nanoscale structure of organic photovoltaic (OPV) materials, and have performed a careful assessment of ...
Nanophysics
Aug 11, 2011
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(Phys.org) -- Using a refined technique for trapping and manipulating nanoparticles, researchers at the National Institute of Standards and Technology (NIST) have extended the trapped particles' useful life more than tenfold. ...
Bio & Medicine
May 3, 2012
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An ultra-high-resolution imaging technique using X-ray diffraction is a step closer to fulfilling its promise as a window on nanometer-scale structures in biological samples. In the Proceedings of the National Academy of ...
General Physics
Dec 7, 2009
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(PhysOrg.com) -- Rohit Bhargava of the University of Illinois has come up with an intriguing new class of molecular probes for biomedical research called nanoLAMPs. Unlike most probes used in biomedicine or other types of ...
Nanophysics
Sep 28, 2010
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(Phys.org)—Researchers from the NIST Center for Nanoscale Science and Technology and Caltech have developed a new design platform for measuring and exploiting strong interactions between light confined in a nanoscale structure ...
Optics & Photonics
Dec 13, 2012
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(Phys.org) —A team of University of Pennsylvania engineers has used a pattern of nanoantennas to develop a new way of turning infrared light into mechanical action, opening the door to more sensitive infrared cameras and ...
Nanophysics
May 20, 2013
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Intelligent self-repairing clothing and sensors that can detect the potential onset of an epileptic seizure sound like the stuff of science fiction but Northumbria University designers and engineers are turning them into ...
Engineering
Sep 4, 2012
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(Phys.org) -- Researchers from the NIST Center for Nanoscale Science and Technology and Massachusetts Institute of Technology have used the scanning electron microscopy with polarization analysis (SEMPA) technique to provide ...
Nanophysics
Apr 19, 2012
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Scientists at the Department of Energy's SLAC National Accelerator Laboratory have invented a customizable chemical etching process that can be used to manufacture high-performance focusing devices for the brightest X-ray ...
General Physics
Jul 23, 2014
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