News tagged with metrology tools
SEMATECH Achieves Submicron 3D IC Bond Alignment Results in Integrated Bonding Tool Platform
Researchers from SEMATECH's 3D Interconnect program based at the College of Nanoscale Science and Engineering's (CNSE) Albany NanoTech Complex have reported advances in wafer-to-wafer bonding alignment accuracies through ...
Jun 10, 2010 |
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Scientists Shed 'Light' on Semiconductor Quandry
(PhysOrg.com) -- UC San Diego scientists are using laser plasma-produced light sources to explore performance improvements of critical inspection tools for the semiconductor industry, which ultimately will ...
Jul 14, 2009 |
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Search results for metrology tools
New detector design improves gamma-ray measurements
(Phys.org) -- In the pursuit of precision measurements, nothing is simple, even when the apparatus employed appears to be utterly uncomplicated. An instructive case in point is the new ionization chamber used ...
Apr 06, 2012 |
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World's first 300mm-fab compatible directed self-assembly process line
At next week’s SPIE Advanced Lithography conference (San Jose, CA), imec announces the successful implementation of the world first 300mm fab-compatible Directed Self-Assembly (DSA) process line all-under-one-roof ...
Feb 10, 2012 |
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Researchers create tool for 'Circuit-Aware' reliability testing
(PhysOrg.com) -- A PML research team has devised a reliability data transformation methodology that could ease one of the semiconductor industry’s most vexing problems: reliability qualification.
Dec 09, 2011 |
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Bright future for gaN nanowires
The gallium nitride nanowires grown by PML scientists may only be a few tenths of a micrometer in diameter, but they promise a very wide range of applications, from new light-emitting diodes and diode lasers ...
Nov 29, 2011 |
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Adding up photons with a transition edge sensor
(PhysOrg.com) -- Scientists have demonstrated that a superconducting detector called a transition edge sensor (TES) is capable of counting the number of as many as 1,000 photons in a single pulse of light ...
Nov 14, 2011 |
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In Brief: Development of a new chip for characterizing ultrafast optical pulses
Boosting up microprocessors -the heart of modern computers- at the speed of light, reducing consumptions and costs, may now be a reality thanks to the development of a new high-performance chip, the results of which have ...
Sep 22, 2011 |
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An octave spanning chip-based optical ruler
More than a decade ago, the frequency comb technique was developed at the Max Planck In-stitute of Quantum Optics by Professor Theodor W. Hänsch. The new tool has stimulated fun-damental research as well ...
Aug 08, 2011 |
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Novel software raises standards of aero engine maintenance
In collaboration with Hong Kong Aero Engine Services Ltd (HAESL), engineers from PolyU’s Industrial Centre (IC) have achieved a breakthrough in aero engine maintenance. By applying mathematics-based software ...
Technology / Energy & Green Tech
Aug 04, 2011 |
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A nanotech solution controlling the path of light can brighten up our lives
We want our electrical devices to have bright screens with low energy needs, so they can be used for a long time before recharge is required. Scientists are increasing the intensity of light by making nanometer ...
Jul 18, 2011 |
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Researchers develop integrated nanomechanical sensor for atomic force microscopy
(PhysOrg.com) -- The atomic force microscope (AFM) is an important tool for nanoscale surface metrology. Typical AFMs map local tip-surface interactions by scanning a flexible cantilever probe over a surface. ...
Jun 02, 2011 |
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List of search results for metrology tools
