Archive: 05/28/2004

Scaling Friction Down to the Nano/Micro Realm

An improved method for correcting nano- and micro-scale friction measurements has been developed by researchers at the National Institute of Standards and Technology (NIST). The new technique should help designers ...

May 28, 2004 not rated yet 0

STATS Introduces Silicon Based System-in-Package Solution

ST Assembly Test Services Ltd (STATS) developed a new technology, called chip scale module package (CSMP), which involves the fabrication of passive devices such as resistors, capacitors, inductors, filters, baluns and interconnects ...

May 28, 2004 not rated yet 0

Samsung Develops 70-nanometer DRAM Process Technology

The industry’s first development of 70-nanometer DRAM process technology employing the CVD method Samsung Electronics announced that it has developed the industry’s first “CVD aluminum” process technology, the very lat ...

May 28, 2004 5 / 5 (1) 0
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